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核工业西南物理研究院 ›› 2023, Vol. 43 ›› Issue (4): 457-461.DOI: 10.16568/j.0254-6086.202304014

• 等离子体物理 • 上一篇    下一篇

基于二次电子发射的中性束剖面诊断系统设计 

於子辰 1, 2,陈玉庆 2 ,许永建*2, 3,陈丽萍 1, 2, 刘晓雪 1, 2,吴征威 3 ,毛文哲 3   

  1. (1. 安徽大学物质科学与信息技术研究院,合肥 230601; 2. 中国科学院等离子体物理研究所,合肥 230031; 3. 中国科学技术大学,合肥 230031) 
  • 收稿日期:2021-07-28 修回日期:2022-10-29 出版日期:2023-12-15 发布日期:2023-12-07
  • 作者简介:於子辰(1996−),男,安徽合肥人,硕士研究生,从事中性束剖面诊断系统的设计与实验相关研究。
  • 基金资助:
    中国科学院合肥大科学中心协同创新培育基金(2020HSC-CIP016)

Design of neutral beam diagnostic system based on secondary electron emission 

YU Zi-chen1, 2, CHEN Yu-qing2 , XU Yong-jian2, 3, CHEN Li-ping1, 2, LIU Xiao-xue1, 2, WU Zheng-wei3 , MAO Wen-zhe3     

  1. (1. Institute of Physical Science and Information Technology, Anhui University, Hefei 230601; 2. Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230031; 3. University of Science and Technology of China, Hefei 230031) 
  • Received:2021-07-28 Revised:2022-10-29 Online:2023-12-15 Published:2023-12-07

摘要: 阐述了 NBI 系统长脉冲束中二次电子的发射原理,分析了束能量与靶表面温度对二次电子发射系数的影响,通过有限元分析模拟建立实际靶板模型进行初步模拟验证,并提出了基于二次电子数据反演的束功率密度 剖面的处理方法,给出了束诊断系统的设计流程图,分析了系统各组成部分和系统整体运行方式,确定了基于二次电子发射束剖面诊断探针设计。

关键词: 中性束注入, 束诊断, 二次电子发射, 系统设计, 束剖面

Abstract: A beam diagnostic system based on secondary electron emission for neutral beam injector (NBI) is designed. The principle of secondary electron emission is described, and the influence of beam energy and calorimeter surface temperature on secondary electron emission coefficient is analyzed. Then actual target model is established for preliminary simulation verification through the finite element analysis. A processing method of beam power density profile based on secondary electron data inversion is proposed, and the components of the system and the overall operation mode of the system are analyzed. The design flow chart of the beam diagnosis system is given, and the design of the diagnostic probe based on the secondary electron emission beam profile is determined. 

Key words: Neutral beam injector, Beam diagnostic, Secondary electron emission, System design, Beam profile

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