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核聚变与等离子体物理 ›› 2012, Vol. 32 ›› Issue (2): 128-132.

• 等离子体物理学 • 上一篇    下一篇

N2-Ar射频放电表面氮化的等离子体特性模拟

孙 倩,杨 莹,赵海涛,郝莹莹,张连珠,赵国明   

  1. (1. 河北师范大学物理科学与信息工程学院,石家庄 050024;2. 河北正定中学,正定 050800)
  • 收稿日期:2011-10-04 修回日期:2012-03-02 出版日期:2012-06-15 发布日期:2011-06-14
  • 作者简介:孙倩(1986-),女,河北衡水人,硕士研究生,从事低温等离子体物理研究。
  • 基金资助:

    河北省自然科学基金资助项目(A2012205072)

N2-Ar rf discharge surface nitriding plasma characteristics simulation

SUN Qian, YANG Ying, ZHAO Hai-tao, HAO Ying-ying, ZHANG Lian-zhu, ZHAO Guo-ming   

  1. (1. College of Physical Science and Information Engineering, Hebei Normal University, Shijiazhuang 050024; 2. Hebei Zhengding Middle School, Zhengding 050800)
  • Received:2011-10-04 Revised:2012-03-02 Online:2012-06-15 Published:2011-06-14

摘要:

N2-Ar射频放电等离子体广泛应用于微电子工业的刻蚀、氮化物薄膜的制备及金属表面氮化等技术领域。开发了N2-Ar混合气体容性耦合射频放电PIC/MC自洽模

型,模型主要描述了e-,N2+,N+,Ar+等主要带电粒子的行为分布。等离子体的碰撞过程分别考虑了带电粒子(e-,N2+,N+,Ar+)与基态中性N2分子和Ar原子

的21种碰撞反应过程。模拟结果表明,在纯N2及N2-Ar混合气体容性耦合射频放电中,各种带电粒子的数密度都在等离子体区达到最大值,且氮分子离子为主要

粒子;在N2容性耦合射频放电中,加入10%氩气时,N+平均能量有所增加,在射频电极处两种氮离子(N2+,N+)高能粒子所占比例增加。本研究对认识N2-Ar射

频放电等离子体过程微观机理具重要意义。

关键词: N2-Ar射频放电, PIC/MC模型, 氮等离子体

Abstract:

N2-Ar rf discharge plasma is used in numerous widespread applications, such as the etching in microelectronics industry, the preparation of nitrides film and the metal surface nitriding and so on. A PIC/MC model for the N2-Ar mixture gas capacitively coupled rf discharge processes was developed, in which we describe the behaviour of the main charged particles(e-, N2+, N+, Ar+)and take into account 21 kinds of collisions of charged particles(e-, N2+, N+, Ar+)with ground-state neutral N2 and Ar. It turned out that however in the N2-Ar mixture gas discharge or N2 gas discharge, the density of charged particles all has the maximum in the plasma region, especially, N2+ is the main particle. In the N2 gas capacitively coupled rf discharge, with the adding of 10% Ar, the mean energy of N+ is increasing, and the high-energy proportion of the two particles (N2+, N+) in the rf electrode are both increasing. So it was important for us to know the microscopic mechanism of N2-Ar rf discharge.

Key words: N2-Ar rf discharge, PIC/MC simulation, N2 plasma

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