提高HT-7放电平顶阶段等离子体密度对逃逸电子的影响

核聚变与等离子体物理 ›› 2012, Vol. 32 ›› Issue (3): 213-217.

提高HT-7放电平顶阶段等离子体密度对逃逸电子的影响

竹锦霞1，段卓琦2，朱俊2，方达2，陈忠勇2

(1. 四川文理学院物理与工程技术系，达州 635000；2. 云南师范大学物理与电子信息学院，昆明 650092)

收稿日期:2011-11-03 修回日期:2012-07-23 出版日期:2012-09-15 发布日期:2012-09-14
作者简介:竹锦霞(1976-)，女，四川雅安人，硕士，讲师，主要从事托卡马克逃逸电子的实验研究。
基金资助:
ITER国内配套研究专项(2009GB104003)；教育部科学技术研究重点项目(208129)；国家自然科学研究基金(11005090)；云南省教育厅科学研究基金项目(09J0025)

Reducing of runaway electrons by increasing plasma density on HT-7 tokamak

ZHU Jin-xia1, DUAN Zhuo-qi2, ZU Jun2，FANG Da2, CHEN Zhong-yong2

(1. Department of Physics and Engineering Technology,Sichuan Academy of Arts and Sciences, Dazhou 635000;2. College of Physics and Electronic Information, Yunnan Normal University, Kunming 650092)

Received:2011-11-03 Revised:2012-07-23 Online:2012-09-15 Published:2012-09-14

摘要/Abstract

摘要：

利用硬X射线探测系统监测HT-7托卡马克装置中逃逸电子轰击到装置第一壁材料时所产生的高能硬X射线，研究了在放电平顶阶段提高等离子体密度对逃逸电子行为的影响。实验结果表明，通过提高放电平顶阶段等离子体密度，HXR强度迅速降到很低的水平，这意味着能有效减少这个阶段形成的逃逸电子的数目及能量。

关键词: 逃逸电子, 等离子体密度, 硬X射线

Abstract:

Using the hard X-ray (HXR) detection system during the current flat-top phase of ohmic discharge in the HT-7 tokamak, the behaviour of runaway electrons has been studied by means of measuring the HXR produced by the runaway electrons bombarding the first wall material. During plasma density increasing at the phase, we found that HXR intensity is reduced rapidly to a very low level, which implicated that the amount and energy of runaway electrons might be reduced effectively by increasing plasma density at the current flat-top phase.

Key words: Runaway electrons, Plasma density, Hard X-ray

中图分类号:

TL61+2.11

竹锦霞1，段卓琦2，朱俊2，方达2，陈忠勇2. 提高HT-7放电平顶阶段等离子体密度对逃逸电子的影响[J]. 核聚变与等离子体物理, 2012, 32(3): 213-217.

ZHU Jin-xia, DUAN Zhuo-qi, ZHU Jun, FANG Da, CHEN Zhong-yong. Reducing of runaway electrons by increasing plasma density on HT-7 tokamak[J]. NUCLEAR FUSION AND PLASMA PHYSICS, 2012, 32(3): 213-217.

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