[1] Christophe Cardinaud, Marie-Claude Peignon, Pierre- Yves Tessier. Plasma etching: principles, mechanisms, application to micro- and nanotechnologies[J]. Applied Surface Science, 2000, 164(1-4): 72-83.
[2] Guo W, Sawin H H. Review of profile and roughening simulation in microelectronics plasma etching[J]. Journal of Physics D: Applied Physics, 2009, 42(19): 1-17.
[3] Liptak R W, Devetter B, Thomas III J H, et al. SF6 plasma etching of silicon nanocrystals[J]. Nanotechnology, 2009, 20(3): 1-5.
[4] Wilson C G, Gianchandan Y B. Silicon micro-machining using in situ DC microplasmas[J]. Journal of Microelectro Mechanical System, 1996, 10(1): 50-54.
[5] Sankaran R M , Giapis K P. Maskless etching of silicon using patterned microdischarges[J]. Appl. Phys. Lett., 2001, 79(5): 593-595.
[6] Snow E S, Campbell Pual M, Perkins F Keith. Nano- fabrication with proximal probes[J]. Proceedings of the IEEE, 1997, 85(4): 870-873.
[7] Deepak R Sahoo, Walter Häberle, Abu Sebastian, et al. High-throughput intermittent-contact scanning probe microscopy[J]. Nanotechnology, 2010, 21(7): 1-7.
[8] Seungchul Kim, Seung-Woo Kim. AFM-based nanofabrication with assistance of femtosecond pulse laser radiation[J]. Journal of Physics: Conference Series, 2007, 61: 550-554.
[9] 王海, 文莉, 禇家如. 一种新型微小等离子体发生器[J]. 微细加工技术, 2005, 4: 50-52.
[10] Gray David C, Tepermeister I, Sawin Herbert H. Phenomenological modeling of ion-enhanced surface kinetics in fluorine-based plasma etching[J]. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1993, 11(4): 1243-1257. |