[1] Hutchinson I H. Principles of plasma diagnostics [M]. Cambridge: Cambridge University book concern, 1987.
[2] Rice J E, Chanberlain K L. X-ray observations between 10 and 150 keV from the Alcator C tokamak [R]. PFC/GA-88-2, 1988.
[3] Hill K W, Bitter M, Diesso M, et al. Tokamak fusion test reactor prototype X-ray pulse-height analyzer diagnostic [J]. Rev. Sci. Instrum., 1985, 56(5): 840.
[4] Pasini D, Gill R D, Holm J, et al. JET X-ray pulse-height analysis system [J]. Rev. Sci. Instrum., 1988, 59(5): 693.
[5] Hill K W, Bitter M, Goeler S, et al. Excitation for plasma impurity measurements by X-ray diagnostics [J]. Rev. Sci. Instrum., 1988, 59(8): 1825.
[6] Cruz D F, Meijer J H, Donne A J H. Electron velocity distributions measured with soft X-ray PHA at RTP [J]. Rev. Sci. Instrum., 1992, 63(10): 5026.
[7] Palmer J R, Morrison. The use of avalanche photodiodes for the detection of soft X-rays [J]. Rev. Sci. Instrum., 1992, 63(1): 828.
[8] Kishimoto S. Recent developments in the avalanche photodiode X-ray detector for timing and fast counting measurements [J]. Rev. Sci. Instrum., 1995, 6(2): 3214.
[9] Madeira T I, Rodrigues A P, Varandas C A F. Real-time signal analysis on the TCV PHA diagnostic [J]. Rev. Sci. Instrum., 2003, 74(3): 2004.
[10] Chen Z Y, Wan B N, Shi Y J, et al. A compact soft X-ray PHA in the HT-7 tokamak [J]. Nucl. Instrum. and Methods, 2004, 527: 604.
[11] 张轶泼, 杨进蔚, 宋先瑛, 等. HL-2A装置SDD软X射线能谱测量结果 [J]. 核聚变与等离子体物理, 2008, 28(1): 11.
[12] Yang Jinwei, Zhang Yipo, Liao Min, et al. Avalanche phenomenon of superthermal electrons measured by SDD with new SPHA during ECRH [J]. Chin. Phys. Lett., 2008, 25(3): 1022.
[13] 廖敏, 杨进蔚, 陈燎原, 等. 基于通用设备和专用程序的软X射线信号数据采集处理技术 [J]. 核聚变与等离子体物理, 2007, 27(3): 260.
[14] 杨进蔚, 曾庆希, 张炜. 三探头Si(Li)探测器对HL-1M装置中电子温度和重金属杂质测量 [J]. 核电子学与测量技术, 1998, 18(62): 78.
[15] Zhou Jun, Ran Hong, Rao Jun, et al. Design of the ECRH/ECCD laucher system for HL-2A tokamak [J]. Plasma Sci. Tech., 2006, 8: 344.
[16] Pasini D, Gill R D, Holm J, et al. JET X-ray pulse-height analysis system [J]. Rev. Sci. Instrum., 1988, 59: 693.