拓扑材料γ-PtBi2的变温晶体结构研究

doi:10.16568/j.0254-6086.2022s1004

核聚变与等离子体物理 ›› 2022, Vol. 42 ›› Issue (s1): 114-119.DOI: 10.16568/j.0254-6086.2022s1004

拓扑材料γ-PtBi2的变温晶体结构研究

张世车, 刘威, 杨萌, 林宇, 冯娅, 石友国, Kenya Shimada, 杨晓峰, Darren C Peets, 何少龙

(1. 中北大学理学院，太原 030051； 2. 中国科学院宁波材料技术与工程研究所，宁波 315201； 3. 中国科学院物理研究所，北京 100190； 4. 福建省先进高场超导材料与工程协同创新中心，福州 350117； 5. 福建师范大学物理与能源学院，福州 350117； 6. 广岛同步辐射中心，日本广岛 739-0046； 7. 德累斯顿工业大学材料物理研究所，德国德累斯顿 01069； 8. 中国科学院大学材料科学与光电工程中心，北京100049)

收稿日期:2021-08-20 修回日期:2022-01-19 出版日期:2022-05-15 发布日期:2022-05-20
作者简介:张世车(1996-)，男，山西运城人，硕士研究生，从事单晶生长及结构表征。
基金资助:
国家重点研发计划(2016YFA030060, 2017YFA0303600, 2017YFA0302901, 2019YFA0300604)

Study on the temperature-changing crystal structure of topological material γ-PtBi2

ZHANG Shi-ju1, 2, LIU Wei2, YANG Meng3, LIN Yu2, 4, 5, FENG Ya6, SHI You-guo3,Kenya Shimada6, YANG Xiao-feng1, Darren C Peets2, 7, HE Shao-long2, 8

(1. School of Science, North University of China, Taiyuan 030051; 2. Ningbo Institute of Materials Technology and Engineering, CAS, Ningbo 315201; 3. Institute of Physics, Chinese Academy of Sciences, Beijing 100190; 4. Fujian Provincial Collaborative Innovation Center for Advanced High-Field Superconducting Materials and Engineering, Fuzhou 350117; 5. College of Physics and Energy, Fujian Normal University, Fuzhou 350117; 6. Hiroshima Synchrotron Radiation Center, Hiroshima University, Higashi-Hiroshima, Hiroshima Japan 739-0046; 7. Institut fürFestkörper- und Materialphysik, TechnischeUniversität Dresden, Dresden Germany 01069; 8. Center of Materials Science and Optoelectronics Engineering, University of the Chinese Academy of Sciences, Beijing 100049)

Received:2021-08-20 Revised:2022-01-19 Online:2022-05-15 Published:2022-05-20

摘要/Abstract

摘要： 利用X射线衍射(XRD)、角分辨光电子能谱(ARPES)和能带计算的方法研究了不同温度下γ-PtBi2的晶体结构。利用单晶XRD确定了室温下晶体的结构为P31m。为了确定低温时样品的晶体结构，用ARPES测得了样品的电子结构并与计算结果进行了对比，结果显示样品的结构与P31m相吻合，这表明在低温时样品依然保持P31m结构。进一步的高温XRD研究表明，在高温时样品的晶体结构仍为P31m结构。

关键词: 拓扑, X射线衍射, 晶体结构, 角分辨光电子能谱

Abstract: The crystal structure of γ-PtBi₂ at different temperatures was studied by using X-ray diffraction (XRD), angle-resolved photoemission spectroscopy (ARPES) and band-structure calculation methods. The crystal structure at room temperature was determined to be P31m by single crystal XRD. In order to determine the crystal structure of the sample at low temperature, we measured the electronic structure of the sample by ARPES and compared it with the calculated results. The results show that the structure of the sample is consistent with that of P31m, which indicates that the sample still maintains the P31m structure at low temperature. Furthermore, the high temperature XRD study shows that the crystal structure of the sample is still the P31m structure at high temperature.

Key words: Topology, X-ray diffraction, Crystal structure, ARPES

中图分类号:

O785+.3

张世车, 刘威, 杨萌, 林宇, 冯娅, 石友国, Kenya Shimada, 杨晓峰, Darren C Peets, 何少龙. 拓扑材料γ-PtBi2的变温晶体结构研究[J]. 核聚变与等离子体物理, 2022, 42(s1): 114-119.

ZHANG Shi-ju, LIU Wei, YANG Meng, LIN Yu, FENG Ya, SHI You-guo, Kenya Shimada, YANG Xiao-feng, Darren C Peets, HE Shao-long. Study on the temperature-changing crystal structure of topological material γ-PtBi2[J]. Nuclear Fusion and Plasma Physics, 2022, 42(s1): 114-119.

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拓扑材料γ-PtBi2的变温晶体结构研究

Study on the temperature-changing crystal structure of topological material γ-PtBi2

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